• DocumentCode
    3360226
  • Title

    Embedded Memory Field Returns - Trials and Tribulations

  • Author

    Khare, Jitendra B. ; Shah, Amit B. ; Raman, Ashok ; Rayas, Girish

  • Author_Institution
    Ample Commun., Sacramento, CA
  • fYear
    2006
  • fDate
    22-27 Oct. 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper describes efforts towards identifying and fixing the root cause of embedded memory failures in a large Ethernet chip. The solution required an active collaboration between the design house, the memory IP vendor, and the BIST solution provider
  • Keywords
    built-in self test; embedded systems; failure analysis; integrated circuit testing; integrated memory circuits; local area networks; BIST solution provider; Ethernet chip; design house; embedded memory failures; embedded memory field returns; memory IP vendor; Built-in self-test; Collaboration; Costs; Ethernet networks; Physical layer; Protocols; Random access memory; Telecommunication traffic; Testing; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297673
  • Filename
    4079351
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3360226