• DocumentCode
    3360361
  • Title

    Combinational Logic Soft Error Correction

  • Author

    Mitra, Subhasish ; Zhang, Ming ; Waqas, Saad ; Seifert, Norbert ; Gill, Balkaran ; Kim, Kee Sup

  • Author_Institution
    Stanford Univ., CA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    We present two techniques for correcting radiation-induced soft errors in combinational logic - error correction using duplication, and error correction using time-shifted outputs. Simulation results show that both techniques reduce combinational logic soft error rate by more than an order of magnitude. Soft errors affecting sequential elements (latches and flip-flops) at combinational logic outputs are automatically corrected using these techniques
  • Keywords
    combinational circuits; error correction; integrated circuit design; logic design; radiation effects; sequential circuits; combinational logic soft error correction; flip-flops; latches; radiation-induced soft errors; sequential elements; Automatic logic units; Costs; Error analysis; Error correction; Error correction codes; Flip-flops; Logic design; Power system reliability; Protection; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297681
  • Filename
    4079359
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3360361