• DocumentCode
    3360528
  • Title

    Session 16 - Embedded memory

  • Author

    Noda, Kenji ; Vial, Jean-Christophe

  • Author_Institution
    NScore, USA
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Abstract
    Penetrating into sub-tenth micron regime, variations in transistor characteristics are having a more critical impact on the design of high-density memories, such as SRAM, Flash and ROM. In this session, two papers from industry and five papers from academia will be presented.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2018-6
  • Type

    conf

  • DOI
    10.1109/CICC.2008.4672104
  • Filename
    4672104
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3360528