DocumentCode
3361429
Title
A Survey of Test Problems and Solutions
Author
Rearick, Jeff
Author_Institution
Agilent Technol., Santa Clara, CA
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
10
Abstract
The past two decades have seen a steady stream of challenges and responses in the test field. This paper surveys selected key problems and the progression of their solutions, in both topical and intrinsic aspects, with the aim of performing a meta-analysis of the nature of test innovation. The significant track record of success demonstrated by the industry will be put under serious pressure as technology advances
Keywords
integrated circuit testing; meta analysis; surveys; test innovation; test problems; test solutions; Automatic test pattern generation; Automatic testing; Circuit testing; Commercialization; Data engineering; Design engineering; Design for testability; Electronic design automation and methodology; Electronic equipment testing; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297738
Filename
4079416
Link To Document