DocumentCode
3361621
Title
EMI resisting smart-power integrated LIN driver with reduced slope pumping
Author
Redouté, Jean-Michel ; Steyaert, Michiel
Author_Institution
Dept. ESAT, MICAS, Leuven
fYear
2008
fDate
21-24 Sept. 2008
Firstpage
643
Lastpage
646
Abstract
This paper presents the design of a local interconnect network (LIN) smart-power driver exhibiting a high degree of immunity against electromagnetic interference (EMI). Improving previous designed architectures, this circuit switches to a low power consumption mode when there is no EMI, while presenting an increased immunity to slope pumping. Measurements illustrate that this proposed LIN driver complies to the 5 W direct power injection (DPI) specification.
Keywords
driver circuits; electromagnetic interference; EMI resisting smart-power integrated LIN driver; direct power injection specification; electromagnetic interference; local interconnect network; reduced slope pumping; Automotive applications; Driver circuits; Electromagnetic compatibility; Electromagnetic interference; Energy consumption; Impedance; Integrated circuit interconnections; Pollution measurement; Power measurement; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2018-6
Electronic_ISBN
978-1-4244-2019-3
Type
conf
DOI
10.1109/CICC.2008.4672167
Filename
4672167
Link To Document