• DocumentCode
    3361652
  • Title

    FPGA design and implementation of fixed width standard and truncated 6×6-bit multipliers: A comparative study

  • Author

    Rais, Muhammad H.

  • Author_Institution
    Electr. Eng. Dept., King Saud Univ., Riyadh, Saudi Arabia
  • fYear
    2009
  • fDate
    15-17 Nov. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a comparative study of field programmable gate array (FPGA) implementation of standard and truncated multipliers using very high speed integrated circuit hardware description language (VHDL). Truncated multiplier is a good candidate for digital signal processing (DSP) applications such as finite impulse response (FIR) and discrete cosine transform (DCT) etc. Significant reduction in FPGA resources, delay, and power can be achieved using truncated multipliers instead of standard parallel multipliers when the full precision of the standard multiplier is not required. The power and area of truncated 6 × 6-bit multiplier shows significant improvement as compared to standard 6 × 6-bit multiplier. For Xilinx Spartan-3AN (XC3S700ANFGG484-5) FPGA device, truncated multiplier shows a reduction in power and area by 45% and 67% respectively as compared to standard multiplier.
  • Keywords
    digital signal processing chips; field programmable gate arrays; hardware description languages; logic design; multiplying circuits; FPGA design; VHDL; Xilinx Spartan-3AN FPGA device; digital signal processing; discrete cosine transform; field programmable gate array; finite impulse response; standard parallel multipliers; truncated multipliers; very high speed integrated circuit hardware description language; Delay; Digital signal processing; Discrete cosine transforms; Emulation; Field programmable gate arrays; Finite impulse response filter; Hardware; Image processing; Programmable logic devices; Signal processing algorithms; Digital Signal Processing (DSP); Field Programmable Gate Array (FPGA); Spartan 3AN; Truncated Multiplier; VHDL;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2009 4th International
  • Conference_Location
    Riyadh
  • Print_ISBN
    978-1-4244-5748-9
  • Type

    conf

  • DOI
    10.1109/IDT.2009.5404081
  • Filename
    5404081