• DocumentCode
    3363694
  • Title

    Electron holography and HRTEM study of the magnetic microstructure of L10 FePt epitaxial thin film grown on MgO-substrate

  • Author

    Park, J.K. ; Kim, K.W. ; Lee, W.H. ; Yoo, J.H. ; Yang, J.M.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2011
  • fDate
    18-21 Oct. 2011
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    Perpendicular epitaxial film of L10 FePt, showing the c-axis normal to the film plane, was successfully grown on top of MgO substrate using DC-magnetron co-sputtering technique. The electron holography study showed that a columnar epitaxial film displayed only a weak stray-field signal due to the presence of columnar boundaries. The growth of a continuous (full) epitaxial film however revealed characteristic LTEM images for the perpendicular magnetic domains. The electron hologram indicated the presence of the stray-field of induction originating from the perpendicular magnetizations. The reconstructed phase-image displayed a characteristic contrast-fringes pattern, indicating the presence of perpendicular magnetic domain walls. From the phase-shift measurement, the perpendicular magnetic induction strength was estimated to be about 0.27T, which was low. The low induction strength was because the film was weakly ordered due to a low substrate temperature.
  • Keywords
    electromagnetic induction; electron holography; iron alloys; magnetic domain walls; magnetic epitaxial layers; magnetic structure; metallic epitaxial layers; platinum alloys; sputter deposition; transmission electron microscopy; DC-magnetron cosputtering technique; FePt; HRTEM; L10 epitaxial thin film; LTEM image; MgO; MgO-substrate; columnar boundaries; columnar epitaxial film; contrast-fringe pattern; electron holography; magnetic microstructure; perpendicular epitaxial film; perpendicular magnetic domain walls; perpendicular magnetic induction strength; perpendicular magnetization; phase-shift measurement; reconstructed phase-image; stray-field signal; substrate temperature; Epitaxial growth; Magnetic domains; Magnetic films; Magnetic resonance imaging; Perpendicular magnetic recording; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2011 IEEE
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-2139-7
  • Type

    conf

  • DOI
    10.1109/NMDC.2011.6155351
  • Filename
    6155351