• DocumentCode
    3365516
  • Title

    Epitaxial growth of an MgO buffer layer and electrode layer on Si for Pb(Zr,Ti)O3 by PLD

  • Author

    Li, X. ; Sakurai, A. ; Shiratsuyu, K. ; Tanaka, K. ; Sakabe, Y.

  • Author_Institution
    Murata Mfg. Co., Ltd, Kyoto, Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    909
  • Abstract
    Thin films of MgO were grown on Si(100) substrates as a buffer layer for the epitaxial growth of films of Pb(Zr,Ti)O3. A layer of Ir or Pt was also grown on MgO/Si as a bottom electrode layer by pulsed laser deposition. In situ reflection high-energy electron diffraction and an X-ray pole figure confirmed the epitaxial relationship between the film of MgO and the Si(100) substrate, as well as between the layer of Ir or Pt and MgO. The surface and cross-sectional morphologies of films were evaluated by atomic force microscopy and scanning electron microscopy, respectively. The Ir and Pt electrode layers grown on MgO/Si had smooth surfaces good crystallinity. PZT films were also successfully grown epitaxially on the Ir/MgO/Si and Pt/MgO/Si by metal-organic chemical vapor deposition
  • Keywords
    MOCVD; X-ray diffraction; atomic force microscopy; epitaxial layers; ferroelectric thin films; lead compounds; magnesium compounds; pulsed laser deposition; reflection high energy electron diffraction; scanning electron microscopy; silicon; surface structure; texture; vapour phase epitaxial growth; Ir; Ir electrode layer; MOCVD; MgO; MgO buffer layer; PLD; PZT; Pb(Zr,Ti)O3; PbZrO3TiO3; Pt; Pt electrode layer; Si; Si (100) substrates; X-ray pole figure; atomic force microscopy; bottom electrode layer; cross-sectional morphologies; electrode layer; epitaxial growth; epitaxial relationship; in situ reflection high-energy electron diffraction; pulsed laser deposition; scanning electron microscopy; surface morphologies; thin films; Atomic force microscopy; Buffer layers; Electrodes; Electrons; Epitaxial growth; Optical films; Pulsed laser deposition; Semiconductor films; Substrates; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.942465
  • Filename
    942465