DocumentCode
3365649
Title
SEU rates in atmospheric environments: Variations due to cross-section fits and environment models
Author
Hands, A. ; Dyer, C.S. ; Lei, F.
Author_Institution
Aerosp. Div., QinetiQ, Farnborough, UK
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
180
Lastpage
185
Abstract
The wide range in predicted SEU rates in avionics devices is analysed in relation to fitted device cross-section curves (including thermal neutron sensitivity) and the variation between atmospheric radiation models and current standards.
Keywords
SRAM chips; atmospheric radiation; avionics; SEU rates; atmospheric environments; atmospheric radiation; avionics devices; cross-section fits; environment models; fitted device cross-section curves; single event upset; thermal neutron sensitivity; Aerospace electronics; Atmospheric measurements; Atmospheric modeling; Neutrons; Single event upset; Standards; Uncertainty; Single event upsets; atmospheric radiation models and standards; neutron cross-sections;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location
Jyvaskyla
ISSN
0379-6566
Print_ISBN
978-1-4577-0481-9
Type
conf
DOI
10.1109/RADECS.2008.5782708
Filename
5782708
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