• DocumentCode
    3367227
  • Title

    Position measurements of multiple light beams with one position-sensitive detector (PSD)

  • Author

    Qian, Dahong ; Wang, Wanjun ; Busch-Vishniac, Ilene

  • Author_Institution
    Dept. of Mech. Eng., Texas Univ., Austin, TX, USA
  • fYear
    1992
  • fDate
    12-14 May 1992
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    A method for measurement of the positions of multiple light beams irradiating a single two-dimensional lateral-effect position-sensitive detector (PSD) is reported. The measurement method relies on using light sources each of which is modulated at different frequencies and then demodulated in the sensor signal processing circuit using pulse amplitude modulation (PAM). Experimental results show that the maximum difference between the measured positions of one light beam in the presence and absence of another beam is less than 0.25% of full scale. This difference is repeatable and almost uniform throughout the entire PSD workspace; therefore it does not affect the resolution and accuracy of the measurement if the multiple light beams are always present. The test results also show that no change in the linearity and resolution of the sensor results from using multiple light sources simultaneously. The number of light beams which can be used simultaneously is limited only by the bandwidth of the PSD and signal loss considerations
  • Keywords
    photodetectors; position measurement; pulse amplitude modulation; PAM; bandwidth; linearity; monolithic sensor; multiple light beams; position-sensitive detector; pulse amplitude modulation; resolution; signal loss; signal processing circuit; single two-dimensional lateral-effect; Amplitude modulation; Frequency measurement; Frequency modulation; Light sources; Optical modulation; Position measurement; Position sensitive particle detectors; Pulse measurements; Pulse modulation; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
  • Conference_Location
    Metropolitan, NY
  • Print_ISBN
    0-7803-0640-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1992.245089
  • Filename
    245089