DocumentCode
337225
Title
Optimal stimulus design for multi-frequency cell membrane capacitance estimation
Author
Barnett, David W.
Author_Institution
Dept. of Electr. Eng., St. Louis Univ., MO, USA
Volume
5
fYear
1997
fDate
1997
Firstpage
2116
Abstract
Electrical measurements of cell membrane capacitance serve as a marker for cell surface area and, hence, are widely used to study stimulus-secretion coupling in a variety of cells. The fundamental goal is to estimate the fractional (fF) changes in baseline capacitance that occur as secretory granules fuse with the cell membrane and subsequently extrude the contents of the vesicle. In order to confidently detect these minute events the authors have developed a method of optimizing the stimulus waveform in order to minimize the variance of the parameter estimates. The optimization process is constrained by the fact that the authors are severely limited in terms of the overall excursion of the voltage waveform that is used to stimulate the cell. They discuss a method for tailoring the waveform, by adjusting the relative magnitude and phase of the individual components of the multi-frequency stimulus, such that the voltage excursion is minimized. Finally, the authors demonstrate that significant improvements are obtainable using multiple frequencies to further customize the stimulus waveform
Keywords
bioelectric phenomena; biological techniques; biomembranes; capacitance measurement; cellular biophysics; baseline capacitance fractional changes; cell surface area; cellular electrophysiology; multifrequency cell membrane capacitance estimation; optimal stimulus design; stimulus waveform optimization; stimulus-secretion coupling; voltage excursion; Area measurement; Biomembranes; Capacitance measurement; Cells (biology); Electric variables measurement; Event detection; Fuses; Optimization methods; Parameter estimation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1997. Proceedings of the 19th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1094-687X
Print_ISBN
0-7803-4262-3
Type
conf
DOI
10.1109/IEMBS.1997.758770
Filename
758770
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