DocumentCode
3372576
Title
Test Technology Educational Program (TTEP) Tutorials
fYear
2008
fDate
April 27 2008-May 1 2008
Abstract
Provides a listing of current committee members and society officers.
Keywords
Circuit testing; Design engineering; Educational programs; Educational technology; Engineering management; Integrated circuit reliability; Integrated circuit testing; Radio frequency; System testing; Tutorial;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.88
Filename
4511686
Link To Document