• DocumentCode
    3372603
  • Title

    Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems

  • Author

    Dou, Qingqi ; Abraham, Jacob A.

  • Author_Institution
    Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX
  • fYear
    2008
  • fDate
    April 27 2008-May 1 2008
  • Firstpage
    3
  • Lastpage
    8
  • Abstract
    Time interleaved A/D converters (TIADCs) provide an attractive solution to the realization of analog front ends in high speed communication systems. However, gain mismatch, offset mismatch, and sampling time mismatch between time-interleaved channels limit the performance of TIADCs. This paper presents a low-cost test scheme to measure timing mismatch using an undersampling clock. Our method is applicable to an arbitrary number of channels, achieving picosecond resolution with low power consumption. Both simulation and hardware measurements are presented to validate the proposed technique.
  • Keywords
    analogue circuits; analogue-digital conversion; clocks; low-power electronics; telecommunication channels; timing; analog front ends; gain mismatch; high speed communication system; high-speed communication systems; low power consumption; low-cost test; offset mismatch; picosecond resolution; power consumption; sampling time mismatch; time interleaved A/D converter; time-interleaved A/D converters; time-interleaved channels; timing mismatch; undersampling clock; Analog computers; Analog-digital conversion; Clocks; Degradation; Energy consumption; Frequency; Physical layer; Sampling methods; System testing; Timing; High speed testing; Low-cost test; Mixed-signal testing; Time-Interleaved ADC; Timing Mismatch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3123-6
  • Type

    conf

  • DOI
    10.1109/VTS.2008.57
  • Filename
    4511688