DocumentCode
3372603
Title
Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems
Author
Dou, Qingqi ; Abraham, Jacob A.
Author_Institution
Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
3
Lastpage
8
Abstract
Time interleaved A/D converters (TIADCs) provide an attractive solution to the realization of analog front ends in high speed communication systems. However, gain mismatch, offset mismatch, and sampling time mismatch between time-interleaved channels limit the performance of TIADCs. This paper presents a low-cost test scheme to measure timing mismatch using an undersampling clock. Our method is applicable to an arbitrary number of channels, achieving picosecond resolution with low power consumption. Both simulation and hardware measurements are presented to validate the proposed technique.
Keywords
analogue circuits; analogue-digital conversion; clocks; low-power electronics; telecommunication channels; timing; analog front ends; gain mismatch; high speed communication system; high-speed communication systems; low power consumption; low-cost test; offset mismatch; picosecond resolution; power consumption; sampling time mismatch; time interleaved A/D converter; time-interleaved A/D converters; time-interleaved channels; timing mismatch; undersampling clock; Analog computers; Analog-digital conversion; Clocks; Degradation; Energy consumption; Frequency; Physical layer; Sampling methods; System testing; Timing; High speed testing; Low-cost test; Mixed-signal testing; Time-Interleaved ADC; Timing Mismatch;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.57
Filename
4511688
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