• DocumentCode
    3373183
  • Title

    The modification of IRI model for Chinese region and its verification

  • Author

    Yan, Zhao-wen ; Wang, Gang ; Han, Ya-jing ; Che, Ming-ming ; Su, Dong-lin ; Rahman, Toyobur

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    1-3 Nov. 2011
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    The International Reference Ionosphere model (IRI) is generally accepted standard ionosphere model. It describes the ionosphere environment in quiet state and predicts the ionosphere parameters within a certain precision. In this paper, we´ve made a breakthrough in modifying the IRI model for Chinese region. Construct the ionosphere parameters foF2 and M(3000)F2 by using the CRI (Chinese Reference Ionosphere) coefficients, appropriately increase hmE, hmF2 height, reduce the thickness of F layer, validate the parameter by the measured values, and solve the electron concentration distribution with QPS (quasi-parabolic segments). Then, 3D ray tracing algorithm was constructed based on the modified IRI model and IGRF geomagnetic field model. Finally, the calculated group paths by using the modified IRI model were compared with experimental results to prove accuracy.
  • Keywords
    F-region; atmospheric structure; ionospheric electromagnetic wave propagation; ray tracing; 3D ray tracing algorithm; CRI coefficients; Chinese Reference Ionosphere coefficients; F layer; IGRF geomagnetic field model; International Reference Ionosphere model; M(3000)F2 ionosphere parameters; QPS; electron concentration distribution; foF2 ionosphere parameters; modified IRI model; quasiparabolic segments; Adaptation models; Ionosphere; Mathematical model; Ray tracing; Refractive index; Solid modeling; Three dimensional displays; IGRF; IRI; group path; ray tracing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8265-8
  • Type

    conf

  • DOI
    10.1109/MAPE.2011.6156287
  • Filename
    6156287