DocumentCode
3373290
Title
Moving-Mask UV Lithography for 3-Dimensional Positive-And Negative-Tone Thick Photoresist Microstructuring
Author
Hirai, Y. ; Inamoto, Y. ; Sugano, K. ; Tsuchiya, T. ; Tabata, O.
Author_Institution
Kyoto Univ., Kyoto
fYear
2007
fDate
10-14 June 2007
Firstpage
545
Lastpage
548
Abstract
This paper presents a systematic study on "Moving-mask UV lithography" for 3-D (three- dimensional) micro structuring of positive- and negative-tone thick photoresist and a dedicated UV lithography process simulation. As an application of the moving-mask UV lithography, we propose a novel method to fabricate embedded microfluidic structures using SU-8. Furthermore, we propose a new practical photoresist profile simulation approach adopting the "Fast Marching Method" to consider the photoresist dissolution vector in the development process. Through a series of moving-mask UV lithography experiments, (1) the capability of the moving-mask UV lithography for 3-D microstructuring, and (2) the validity of the proposed photoresist profile simulation, were successfully confirmed.
Keywords
microfluidics; photoresists; ultraviolet lithography; 3D positive-negative-tone thick photoresist microstructuring; development process; embedded microfluidic structures; fast marching method; moving-mask UV lithography; photoresist dissolution vector; Employment; Lithography; Mechanical systems; Microchannel; Microfluidics; Micromechanical devices; Microstructure; Optical distortion; Predictive models; Resists; 3-dimensional microfabrication; UV lithography; simulation; thick photoresist;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location
Lyon
Print_ISBN
1-4244-0842-3
Electronic_ISBN
1-4244-0842-3
Type
conf
DOI
10.1109/SENSOR.2007.4300188
Filename
4300188
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