• DocumentCode
    3373290
  • Title

    Moving-Mask UV Lithography for 3-Dimensional Positive-And Negative-Tone Thick Photoresist Microstructuring

  • Author

    Hirai, Y. ; Inamoto, Y. ; Sugano, K. ; Tsuchiya, T. ; Tabata, O.

  • Author_Institution
    Kyoto Univ., Kyoto
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    545
  • Lastpage
    548
  • Abstract
    This paper presents a systematic study on "Moving-mask UV lithography" for 3-D (three- dimensional) micro structuring of positive- and negative-tone thick photoresist and a dedicated UV lithography process simulation. As an application of the moving-mask UV lithography, we propose a novel method to fabricate embedded microfluidic structures using SU-8. Furthermore, we propose a new practical photoresist profile simulation approach adopting the "Fast Marching Method" to consider the photoresist dissolution vector in the development process. Through a series of moving-mask UV lithography experiments, (1) the capability of the moving-mask UV lithography for 3-D microstructuring, and (2) the validity of the proposed photoresist profile simulation, were successfully confirmed.
  • Keywords
    microfluidics; photoresists; ultraviolet lithography; 3D positive-negative-tone thick photoresist microstructuring; development process; embedded microfluidic structures; fast marching method; moving-mask UV lithography; photoresist dissolution vector; Employment; Lithography; Mechanical systems; Microchannel; Microfluidics; Micromechanical devices; Microstructure; Optical distortion; Predictive models; Resists; 3-dimensional microfabrication; UV lithography; simulation; thick photoresist;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300188
  • Filename
    4300188