DocumentCode
3373628
Title
Realization of Thin Film Specimens for Micro Tensile Tests
Author
Malhaire, Christophe ; Ignat, Michel ; Dogheche, Karim ; Brida, Sebastiano ; Josserond, Charles ; Debove, Laurent
Author_Institution
UMR 5511, Villeurbanne
fYear
2007
fDate
10-14 June 2007
Firstpage
623
Lastpage
626
Abstract
This paper is focused on specimen´s design and fabrication for micro tensile tests. The experimental approach is based on a new micro tensile testing system and the development of silicon frames sustaining submicron thick self-standing films. The beam design has been optimized using Finite Element Simulations. SiN and Al beams with very large length on thickness ratio have been released from silicon substrate using standard etching process. The experimental force-displacement curve that has been obtained on a 3 mm x 400 mum times 1 mum aluminum beam is shown and discussed.
Keywords
etching; finite element analysis; micromechanical devices; tensile testing; thin films; finite element simulations; microtensile tests; silicon frames; standard etching process; thin film specimens; Automatic testing; Design optimization; Etching; Fabrication; Finite element methods; Semiconductor films; Silicon compounds; Substrates; System testing; Transistors; Finite Element Modeling; MEMS; Micro tensile test; Young´s modulus;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location
Lyon
Print_ISBN
1-4244-0842-3
Electronic_ISBN
1-4244-0842-3
Type
conf
DOI
10.1109/SENSOR.2007.4300207
Filename
4300207
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