• DocumentCode
    3373956
  • Title

    Efficiently detecting arbitrary shaped clusters in image databases

  • Author

    Yu, Dantong ; Chatterjee, Surojit ; Zhang, Aidong

  • Author_Institution
    Dept. of Comput. Sci. & Eng., State Univ. of New York, Buffalo, NY, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    187
  • Lastpage
    194
  • Abstract
    Image databases contain data with high dimensions. Finding interesting patterns in these databases poses a very challenging problem because of the scalability, lack of domain knowledge and complex structures of the embedded clusters. High dimensionality adds severely to the scalability problem. In this paper, we introduce WaveCluster+, a novel approach to apply wavelet-based techniques for clustering high-dimensional data. Using a hash-based data structure to represent the data set, we offer a detailed technique to apply a wavelet transform on the hashed feature space. We demonstrate that the cost of clustering can be reduced dramatically yet maintaining all the advantages of wavelet-based clustering. This hash-based data representation can be applied for any grid-based clustering approaches. The experimental results show the effectiveness and efficiency of our method on high-dimensional data sets
  • Keywords
    data mining; pattern clustering; spatial data structures; visual databases; wavelet transforms; WaveCluster+; arbitrary shaped cluster detection; complex structures; data representation; dimensionality; domain knowledge; grid-based clustering; hash-based data structure; hashed feature space; high-dimensional data clustering; image databases; pattern discovery; scalability; wavelet transform; wavelet-based clustering; Clustering algorithms; Clustering methods; Computer science; Data mining; Image databases; Image retrieval; Information retrieval; Partitioning algorithms; Spatial databases; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 1999. Proceedings. 11th IEEE International Conference on
  • Conference_Location
    Chicago, IL
  • ISSN
    1082-3409
  • Print_ISBN
    0-7695-0456-6
  • Type

    conf

  • DOI
    10.1109/TAI.1999.809785
  • Filename
    809785