DocumentCode
3374117
Title
The analysis of surface deformation based on two-pass and three-pass D-InSAR
Author
Qu Ning-ning ; Zhu Guang ; Zhao Xi-an ; Jing Chang-feng ; Lv Jing-guo
Author_Institution
Coll. of Geomatics, Beijing Univ. of Civil Eng. & Archit., Beijing, China
fYear
2010
fDate
25-30 July 2010
Firstpage
4561
Lastpage
4563
Abstract
The Differential Synthetic Aperture Radar Interferometry (D-InSAR) is widely used in large-scale ground deformation monitoring such as crustal deformation, seismic changes, land subsidence, landslides, volcanic deformation, glacial movement. In this paper, The deformation analysis based on two-pass differential and three-pass differential InSAR is done. We have shown that the analytic results by the three-pass differential method is better. The quality of result may be effected in phase unwrapping in two different methods. The deformation fields obtained by two different differential methods have been compared with traditional methods. With the changes in topographic factor, climatic conditions and vegetation types, the coherence effect is different, results have been given. It is not easy that the strong coherence is satisfied in three SAR images in the same time. Therefore, the optimizing methods depend on the purpose of application and the characteristics of studied area.
Keywords
deformation; geomorphology; radar imaging; radar interferometry; synthetic aperture radar; topography (Earth); vegetation mapping; SAR images; climatic conditions; crustal deformation; differential synthetic aperture radar interferometry; glacial movement; land subsidence; landslides; large-scale ground deformation monitoring; seismic changes; surface deformation; three-pass D-InSAR; topographic factor; two-pass D-InSAR; vegetation type; volcanic deformation; Coherence; Earthquakes; Interferometry; Satellites; Surface topography; Synthetic aperture radar; Coherence; D-InSAR; InSAR; three-pass; two-pass;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5654001
Filename
5654001
Link To Document