• DocumentCode
    3374913
  • Title

    Multi Domain Test: Novel test strategy to reduce the Cost of Test

  • Author

    Takahashi, Yasuhiro ; Maeda, Akinori

  • Author_Institution
    S&S Prof. Service, Verigy Japan K.K., Hachioji, Japan
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    303
  • Lastpage
    308
  • Abstract
    The Multi-Domain-Test is the new test strategy to resolve problems and limitations of the Multi-Site-Test and the Concurrent-Test. By this novel test strategy, test time can be reduced down to 50% of the Single-Site-Test with almost the same amount of tester resources. Cost Of Test (COT) can be lower than the Multi-Site-Test that is well used at productions.
  • Keywords
    automatic test equipment; integrated circuit testing; COT; concurrent-test; cost-of-test; multidomain test; multisite-test; IP networks; Interference; Performance evaluation; Power supplies; Production; Sockets; System-on-a-chip; Concurrent Test Multi Site Test; Costs Of Test (COT); Multi Domain Test; Test System Configuration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783738
  • Filename
    5783738
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3374913