DocumentCode
3375775
Title
Electro-Mechanical Measurement of Nano Wires -Evaluation of Lambda DNA Wire Coated with Palladium Nano Particles
Author
Hosogi, M. ; Hashiguchi, G. ; Ayano, K. ; Takahashi, H. ; Haga, M. ; Yonezawa, T. ; Fujita, H.
Author_Institution
Kagawa Univ., Kagawa
fYear
2007
fDate
10-14 June 2007
Firstpage
1071
Lastpage
1074
Abstract
We have measured conductivity of palladium coated DNA nano wires using micromachined tweezers. In the experiment, we configured an atomic force microscope (AFM) to the electrical measurement of bridged nano wires between the tweezers probes and utilized a special AFM cantilever having a knife-wedge shape tip with a very low spring constant for applying a loading force to the wire. Using the apparatus, an electric current through the wire was monitored applying 0.5 DC voltage while in a loading and unloading process. The resistance of the wire was changed apparently by the deformation; we estimated the gauge factor 4.87. As demonstrated here, this method is useful for an electro-mechanical evaluation technique of nano materials.
Keywords
DNA; atomic force microscopy; electrical conductivity; electromechanical effects; micromachining; nanoparticles; nanowires; palladium; AFM cantilever; Pd; atomic force microscope; bridged nanowires; conductivity measurement; lambda DNA wire; micromachined tweezers; nanoparticles; nanowire electro-mechanical measurement; voltage 0.5 V; Atomic force microscopy; Atomic measurements; Conductivity measurement; DNA; Electric variables measurement; Force measurement; Palladium; Particle measurements; Shape measurement; Wires; AFM; DNA Tweezers; DNA-Pd Wire; Pd nano particle; piezo-resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location
Lyon
Print_ISBN
1-4244-0842-3
Electronic_ISBN
1-4244-0842-3
Type
conf
DOI
10.1109/SENSOR.2007.4300319
Filename
4300319
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