DocumentCode
3375826
Title
Excellent passivation structure of high efficiency multicrystalline silicon solar cells
Author
Sun, Wen-Chin ; Chen, Chien-Hsun ; Huang, Chien-Rong ; Du, Chen-Hsun ; Wang, T.Y. ; Lan, Chung-Wen
Author_Institution
Photovoltaics Technology Center Industrial Technology Research Institute, Hsinchu, Taiwan
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
4
Abstract
The passivation effects for multicrystalline silicon solar cell with different configurations are investigated. Al2 O3 and SiO2 films are used as the passivation layer in this work. They are prepared by atomic layer deposition and thermal oxidation, respectively. Using monolayer (Al2 O3 or SiO2 ) as the passivation layer, the cell efficiency is 16.33% and 17.41%, respectively. The excellent passivation structure shows the drastic enhancement in cell efficiency of 19.09%. The quantum efficiency results show the improvement in the IR range, which explains the high energy conversion efficiency for the excellent structure.
Keywords
Atomic layer deposition; Chemical technology; Furnaces; Passivation; Photovoltaic cells; Radiative recombination; Semiconductor films; Silicon; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922434
Filename
4922434
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