• DocumentCode
    3375826
  • Title

    Excellent passivation structure of high efficiency multicrystalline silicon solar cells

  • Author

    Sun, Wen-Chin ; Chen, Chien-Hsun ; Huang, Chien-Rong ; Du, Chen-Hsun ; Wang, T.Y. ; Lan, Chung-Wen

  • Author_Institution
    Photovoltaics Technology Center Industrial Technology Research Institute, Hsinchu, Taiwan
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The passivation effects for multicrystalline silicon solar cell with different configurations are investigated. Al2O3 and SiO2 films are used as the passivation layer in this work. They are prepared by atomic layer deposition and thermal oxidation, respectively. Using monolayer (Al2O3 or SiO2) as the passivation layer, the cell efficiency is 16.33% and 17.41%, respectively. The excellent passivation structure shows the drastic enhancement in cell efficiency of 19.09%. The quantum efficiency results show the improvement in the IR range, which explains the high energy conversion efficiency for the excellent structure.
  • Keywords
    Atomic layer deposition; Chemical technology; Furnaces; Passivation; Photovoltaic cells; Radiative recombination; Semiconductor films; Silicon; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922434
  • Filename
    4922434