• DocumentCode
    3377954
  • Title

    Evaluation of Piezoresistive Effects for Carbon Nanowire using MEMS Actuators

  • Author

    Kiuchi, Mario ; Isono, Yoshitada ; Matsui, Shinji ; Nakamatsu, Kenichiro

  • Author_Institution
    Ritsumeikan Univ., Kusatsu
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    1557
  • Lastpage
    1560
  • Abstract
    This research develops Electrostatic Actuated NAno Tensile testing devices (EANATs) to evaluate mechanical and electrical properties of carbon nanowires fabricated by focus ion beam assisted chemical vapor deposition (FIB-CVD). This research measured I-V characteristics of carbon nanowires, with diameters ranging from 88 nm to 129 nm, under tensile loading in order to evaluate the gauge factor of nanowires. The averaged gauge factor of 0.7 is lower than that of hydrogenated amorphous C films. Discussion of the mechanical and electrical properties of the nanowires is made from scanning electron microscope-energy dispersive X-ray spectrometer (SEM-EDX) and scanning transmission electron microscope (STEM) observations.
  • Keywords
    X-ray chemical analysis; microactuators; nanowires; piezoresistive devices; scanning electron microscopes; tensile testing; IV characteristics; MEMS actuators; carbon nanowire; electrical properties; electrostatic actuated nano tensile testing devices; energy dispersive X ray spectrometer; focus ion beam assisted chemical vapor deposition; gauge factor; hydrogenated amorphous carbon films; mechanical properties; piezoresistive effects; scanning electron microscope; scanning transmission electron microscope; size 88 nm to 129 nm; tensile loading; Actuators; Electrostatics; Ion beams; Mechanical factors; Micromechanical devices; Nanoscale devices; Piezoresistance; Scanning electron microscopy; Testing; Transmission electron microscopy; Carbon Nanowire; FIB-CVD; I-V Characteristics; Tensile Test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300443
  • Filename
    4300443