DocumentCode
3378457
Title
Basic boundary-scan for in-circuit test
Author
Albee, Alan J. ; Ellis, Mark ; Robinson, Gordon D.
Author_Institution
GenRad Inc., Concord, MA, USA
fYear
1993
fDate
19-22 Apr 1993
Firstpage
349
Lastpage
354
Abstract
Boundary-scan was developed to allow testing without a full bed-of-nails, but many boards have only a few boundary-scan parts, and still require a full bed-of-nails. The manufacturers of those boards are getting many advantages from the use of boundary-scan, including faster model development time for complex parts, faster test run times, faster model and board debug times and much more accurate diagnosis than a conventional in-circuit test provides. This paper describes a tool that provides these benefits without needing any change to the main in-circuit test system
Keywords
automatic testing; boundary scan testing; printed circuit testing; BasicSCAN; PCB testing; boundary scan testing; in-circuit model; in-circuit test; test generator; Circuit faults; Circuit testing; Fault detection; Fixtures; Logic devices; Logic testing; Pins; Standards development; System testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246574
Filename
246574
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