• DocumentCode
    3378457
  • Title

    Basic boundary-scan for in-circuit test

  • Author

    Albee, Alan J. ; Ellis, Mark ; Robinson, Gordon D.

  • Author_Institution
    GenRad Inc., Concord, MA, USA
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    349
  • Lastpage
    354
  • Abstract
    Boundary-scan was developed to allow testing without a full bed-of-nails, but many boards have only a few boundary-scan parts, and still require a full bed-of-nails. The manufacturers of those boards are getting many advantages from the use of boundary-scan, including faster model development time for complex parts, faster test run times, faster model and board debug times and much more accurate diagnosis than a conventional in-circuit test provides. This paper describes a tool that provides these benefits without needing any change to the main in-circuit test system
  • Keywords
    automatic testing; boundary scan testing; printed circuit testing; BasicSCAN; PCB testing; boundary scan testing; in-circuit model; in-circuit test; test generator; Circuit faults; Circuit testing; Fault detection; Fixtures; Logic devices; Logic testing; Pins; Standards development; System testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1993. Proceedings of ETC 93., Third
  • Conference_Location
    Rotterdam
  • Print_ISBN
    0-8186-3360-3
  • Type

    conf

  • DOI
    10.1109/ETC.1993.246574
  • Filename
    246574