• DocumentCode
    3378690
  • Title

    Effects of dynamic parameters on measurements of IV curve

  • Author

    Seapan, Manit ; Limsakul, Cham Nan ; Chayavanich, Tasanee ; Kirtikara, Krissanapong Sea ; Chayavanich, Nattavut Sea ; Chenvidhya, Dhirayut

  • Author_Institution
    CES Solar Cells Testing Center (CSSC), King Mongkut´´s University of Technology Thonburi (KMUTT), Thailand
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In current-voltage characteristic measurements of a PV module, distortions of curves can often be observed when measurements are done under flash tester with different sweeping rates of curve tracing, direction of tracing from short circuit to open circuit (SCOC)or from open circuit to short circuit (OCSC). In our recent work, we observed that dissimilarities of IV curves of a PV module, maximum power and fill factor, can be explained in terms of charging or discharging capacitive current due to voltage dependence of solar cells. This paper describes that measured maximum powers of a PV module are deviated around 2% when measurements are done with varying sweeping rates from 2 ms to 10 ms and directions of tracing of SCOC and OCSC conditions. The results are comparable with time constants of a module obtained by using dynamic characterization. Our methods using square wave inputting signal, both in the dark and in the illumination conditions, can determine not only time constants, but also determine dynamic parameters of a module. We found that the overestimation or underestimation of output powers are obtained when the sweeping rates are not more than time constants, and each time constant is depend on each operating voltage.
  • Keywords
    Capacitance; Circuits; Current measurement; Distortion measurement; Electric variables measurement; Photovoltaic cells; Power generation; Sea measurements; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922589
  • Filename
    4922589