• DocumentCode
    3379060
  • Title

    Correlation of current mismatch and fill factor in amorphous and nanocrystalline silicon based high efficiency multi-junction solar cells

  • Author

    Yan, Baojie ; Yue, Guozhen ; Yang, Jeffrey ; Guha, Subhendu

  • Author_Institution
    United Solar Ovonic LLC, 1100 West Maple Road, Troy, Michigan, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We present a systematic analysis of the correlation of current mismatch in a-Si:H/nc-Si:H double-junction solar cell fill factor (FF) measured under colored lights. First, we propose a diagnostic method to evaluate the FFs of component cells in multi-junction solar cells using current-voltage measurements under colored lights. The analysis reveals that the over-estimated FF when a colored light is illuminated results from a significant current mismatch. A mathematical calculation demonstrates that the diagnostic method can be used to estimate the FFs of single-junction component cells in a multi-junction structure. Second, we present our recent progress in the optimization of a-Si:H and nc-Si:H based solar cells. We emphasize the importance of improving the compactness of nc-Si:H materials and controlling the nanocrystalline evolution. Finally, we report our new record initial active-area efficiency of 15.4% achieved using an a-Si:H/a-SiGe:H/nc-Si:H triple-junction structure.
  • Keywords
    Amorphous materials; Circuits; Current measurement; Design optimization; Manufacturing processes; Optical filters; Photovoltaic cells; Silicon; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922607
  • Filename
    4922607