• DocumentCode
    338065
  • Title

    Effect of signal-processing parameters on phase velocity uncertainty

  • Author

    Renken, M.C. ; Fortunko, C.M. ; Mullis, C.T.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    821
  • Abstract
    Quantification of signal-processing effects is required for an accurate determination (less than 1% uncertainty) of the absolute phase velocity, particularly when Fourier techniques are used. The velocity is calculated by using the travel time determined from the phase differences between the spectra of two successive signals. In practice, the frequency spectra are estimated using Discrete Fourier Transforms (DFT). However, using the DFT requires sampling and windowing of the received waveforms. We present a comprehensive and self-consistent method of analysis that allows one to derive a relation for the uncertainty of the phase velocity as a function of the sampling-parameters, window-shape, noise-variance and travel-time. We compare the results of our method with results for a pulse-echo, 5 MHz measurement of the velocity on a 25.4 mm thick steel specimen. For a signal-to-noise ratio of 40 dB, the theoretically predicted and experimentally determined imprecisions are 0.07% and 0.05% respectively
  • Keywords
    acoustic noise; acoustic signal processing; carbon steel; discrete Fourier transforms; ultrasonic materials testing; ultrasonic propagation; ultrasonic velocity; ultrasonic waves; discrete Fourier transforms; noise-variance; phase velocity uncertainty; sampling-parameters; self-consistent method; signal-processing parameters effect; signal-to-noise ratio; thick steel specimen; travel-time; Discrete Fourier transforms; Frequency estimation; Phase noise; Pulse measurements; Sampling methods; Signal to noise ratio; Steel; Thickness measurement; Uncertainty; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.762270
  • Filename
    762270