• DocumentCode
    3381335
  • Title

    Improving verification coverage of analog circuit blocks by state space-guided transient simulation

  • Author

    Steinhorst, Sebastian ; Hedrich, Lars

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Frankfurt/Main, Main, Germany
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    645
  • Lastpage
    648
  • Abstract
    In this contribution a novel methodology for verification of analog circuit blocks with the aim of full coverage of the analog state space is proposed. On a discretized state space model of the analog system, an efficient state space-guided input stimuli generation algorithm produces piecewise linear input stimuli for every input of the system under verification. Processed by a conventional transient circuit simulator, the simulation results are covering the system´s complete dynamic behavior. Simulation by complete state space-covering input stimuli guarantees the verification results to be sound for every possible state and input stimulus of the circuit under verification, which increases the significance of property verification and equivalence checking of transistor netlists versus behavioral models. The application to example circuits shows the feasibility of the approach.
  • Keywords
    analogue circuits; circuit simulation; state-space methods; transient analysis; transistors; analog circuit block verification; discretized state space model; efficient state space-guided input stimuli generation algorithm; piecewise linear input stimuli; state space-guided transient simulation; transient circuit simulator; transistor netlist equivalence checking; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Design methodology; Formal verification; Signal design; State-space methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537507
  • Filename
    5537507