• DocumentCode
    3382504
  • Title

    Growth of μc-Si active layer in a-Si/μc-Si solar cell: An optimization of growth process through modification of active layer near p/i interface

  • Author

    Das, Chandan ; Smirnov, Vladimir ; Melle, Thomas ; Lambertz, Andreas ; Reetz, Wilfried ; Carius, Reinhard ; Finger, Friedheim

  • Author_Institution
    IEF5- Photovoltaics, Forschungszentrum Juelich GmbH, Juelich, 52428, Germany
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The growth of μc-Si active layer has been investigated in a-Si/μc-Si superstrate p-i-n solar cells. The growth of μc-Si i-layer seems to have considerable dependence on the immediate substrate it is growing on. In superstrate configuration, the p-layer of μc-Si cell in an a-Si/μc-Si cell should attain the required properties for doping, window, recombination layer, and for seed layer of μc-Si intrinsic layer growth in the bottom cell. An easy approach to fabricate μc-Si solar cells would be to decouple the requirements for a p-layer. In this article, a modification of the growth condition of μc-Si i-layer near the p/i interface has been demonstrated to fabricate a-Si/μc-Si solar cells starting with a non-optimized p-layer in terms of seeding requirements. The solar cell performance has been improved with this modification by decoupling the role of p-layer as seed layer for μc-Si growth. The structural properties of the i-layer have been investigated with Raman spectroscopy. An initial conversion efficiency of 11.3% has been achieved in this work.
  • Keywords
    Amorphous materials; Crystalline materials; Crystallization; Fabrication; PIN photodiodes; Photovoltaic cells; Semiconductor thin films; Silicon; Substrates; Windows;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922766
  • Filename
    4922766