Diagnosis of soft-fault in analog circuit based on FNLP

Author

Shi, Yibing ; Zhou, Longfu ; Zhang, Wei

Author_Institution

Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2009

fDate

23-25 July 2009

Firstpage

1078

Lastpage

1081

Abstract

A new soft-fault diagnosis approach for analog circuit with parameter tolerance is proposed in this paper. The approach uses fuzzy nonlinear programming (FNLP) concept to diagnose analog circuit under test quantitatively. Node-voltage incremental equations, as constraints of FNLP equation, are built based on the sensitivity analysis. Through evaluating the parameters deviations from the solution of the FNLP equation, it can be stated that whether the actual parameters are within tolerance ranges or some components are faulty. Examples illustrate the proposed approach and show its effectiveness.

Keywords

analogue circuits; circuit testing; fault diagnosis; nonlinear programming; sensitivity analysis; FNLP concept; analog circuit under test; fuzzy nonlinear programming; node-voltage incremental equation; parameter tolerance; sensitivity analysis; soft-fault diagnosis approach; Analog circuits; Circuit faults; Circuit testing; Costs; Fault diagnosis; Linear programming; Manufacturing industries; Nonlinear equations; Sensitivity analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, Circuits and Systems, 2009. ICCCAS 2009. International Conference on

Conference_Location

Milpitas, CA

Print_ISBN

978-1-4244-4886-9

Electronic_ISBN

978-1-4244-4888-3

Type

conf

DOI

10.1109/ICCCAS.2009.5250333

Filename

5250333