DocumentCode
3386655
Title
AMS and RF design for reliability methodology
Author
Ferreira, Pietro M. ; Petit, Hervé ; Naviner, Jean-François
Author_Institution
Telecom ParisTech, Inst. Telecom, Paris, France
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
3657
Lastpage
3660
Abstract
The design for reliability concept is already in use on digital circuits, but not systematically in use on AMS or RF circuits. A reliable circuit design demands knowledge of the physical degradation and models to analyze the reliability in earlier stages. Also, it needs to be simple enough to be used on the redesign. In this work, we propose and validate an AMS and RF circuit design for reliability method. In order to investigate our method, we have designed a 5-3 NOR interpolative Digital Controlled Oscillator (DCO) near 1 GHz applications. This design example has presented 1.4% decrease of oscillation frequency, 0.2% decrease of phase noise for a 1 MHz off-set, and 2.1% decrease of power consumption after 10 years of degradation. According with the trends presented in Table I, we estimate that the fosc ageing degradation was improved of 13% by applying the design for reliability method.
Keywords
NOR circuits; circuit reliability; radiofrequency oscillators; AMS circuit design; NOR interpolative digital controlled oscillator; RF circuit design; design for reliability concept; digital circuits; fosc ageing degradation; oscillation frequency; power consumption; reliability methodology; Aging; Circuit synthesis; Degradation; Design methodology; Digital circuits; Digital control; Digital-controlled oscillators; Energy consumption; Phase noise; Radio frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537771
Filename
5537771
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