• DocumentCode
    3387045
  • Title

    Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices

  • Author

    Yahagi, Yasuo ; Saito, Yuya ; Terunuma, K. ; Nunomiya, T. ; Nakamura, T.

  • Author_Institution
    Production Eng. Res. Lab., Hitachi Ltd, Yokohama, Japan
  • fYear
    2002
  • fDate
    21-24 Oct. 2002
  • Firstpage
    143
  • Lastpage
    146
  • Abstract
    Concerns about Single Event Upset (SEU) induced by terrestrial neutron at the ground are growing as scaling down of semiconductor device proceeds. A highly integrated procedure named SECIS (SElf-Consistent Integrated System for susceptibility to terrestrial neutron soft-error) is proposed to estimate soft-error rate (SER) at any place on the earth. A good agreement is obtained from SECIS within 35% error between the measured and estimated SERs in three locations in Japan.
  • Keywords
    errors; neutron effects; semiconductor device testing; semiconductor storage; 0.25 micron; SECIS; self-consistent integrated system; semiconductor memory device testing; single event upset; soft error rate; terrestrial neutron irradiation; Acceleration; Charge measurement; Current measurement; Earth; Energy measurement; Neutrons; Nuclear measurements; Particle beams; Semiconductor devices; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2002. IEEE International
  • Print_ISBN
    0-7803-7558-0
  • Type

    conf

  • DOI
    10.1109/IRWS.2002.1194253
  • Filename
    1194253
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3387045