• DocumentCode
    3387222
  • Title

    5a: Panel session ?? Robust design from unreliable components: Why? When? How?

  • fYear
    2005
  • fDate
    1-5 May 2005
  • Firstpage
    171
  • Lastpage
    171
  • Abstract
    Summary form only given, as follows. Design of robust systems meeting stringent quality, reliability, and availability requirements is becoming increasingly difficult in advanced technologies. The current design paradigm assumes that no gate or interconnect will ever fail within the lifetime of a product. The panelists will debate whether this design paradigm must change, and whether new architectural features are required for robust system design with built-in mechanisms for failure tolerance, detection and recovery during normal operation.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
  • Conference_Location
    Palm Springs, California, USA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2314-5
  • Type

    conf

  • DOI
    10.1109/VTS.2005.14
  • Filename
    1443418