DocumentCode
3387222
Title
5a: Panel session ?? Robust design from unreliable components: Why? When? How?
fYear
2005
fDate
1-5 May 2005
Firstpage
171
Lastpage
171
Abstract
Summary form only given, as follows. Design of robust systems meeting stringent quality, reliability, and availability requirements is becoming increasingly difficult in advanced technologies. The current design paradigm assumes that no gate or interconnect will ever fail within the lifetime of a product. The panelists will debate whether this design paradigm must change, and whether new architectural features are required for robust system design with built-in mechanisms for failure tolerance, detection and recovery during normal operation.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
Conference_Location
Palm Springs, California, USA
ISSN
1093-0167
Print_ISBN
0-7695-2314-5
Type
conf
DOI
10.1109/VTS.2005.14
Filename
1443418
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