DocumentCode
3388624
Title
Linear Dynamical System Response Modeling of Trial-to-Trial Amplitude Variability in Event-Related MEG/EEG
Author
Limpiti, Tulaya ; Van Veen, Barry D. ; Nagarajan, Srikantan S. ; Attias, Hagai T.
Author_Institution
University of Wisconsin-Madison, Dept. of Electrical and Computer Engineering, Madison, WI
fYear
2007
fDate
26-29 Aug. 2007
Firstpage
151
Lastpage
155
Abstract
We propose a linear dynamical system response (LDSR) model to describe amplitude variability across trials in event-related magnetoencephalographic/electroencephalographic (MEG/EEG) data. Variability across trials may reflect habituation, fatigue, or changes in cognitive states of the brain. A wide range of trial-to-trial variability can be represented using the LDSR model, including the constant response (CR) model as a limiting case. The spatiotemporal signal waveform is assumed constant but unknown, and is represented using a linear combination of spatial and temporal basis functions. The background noise is assumed to be spatially correlated with unknown covariance matrix. We obtain the maximum-likelihood estimates of the amplitude variability and signal waveform via a generalized Expectation-Maximization algorithm. The expectation step involves a Kalman fixed-interval smoother which tracks the trial-to-trial amplitude variability while the maximization step estimates the signal waveform, spatial noise covariance, and LDSR model parameters. We demonstrate the effectiveness of the proposed model using both real and simulated evoked response data. The performance of the algorithm is analyzed in terms of the mean squared error of the amplitude estimates.
Keywords
Amplitude estimation; Background noise; Brain modeling; Chromium; Covariance matrix; Electroencephalography; Expectation-maximization algorithms; Fatigue; Maximum likelihood estimation; Spatiotemporal phenomena; Event-related MEG; Expectation-maximization; Linear dynamic model; Maximum likelihood; Trial variability;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location
Madison, WI, USA
Print_ISBN
978-1-4244-1198-6
Electronic_ISBN
978-1-4244-1198-6
Type
conf
DOI
10.1109/SSP.2007.4301237
Filename
4301237
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