• DocumentCode
    3389996
  • Title

    BSIM-IMG: Compact model for RF-SOI MOSFETs

  • Author

    Kushwaha, Pragya ; Agarwal, Harshit ; Khandelwal, Sourabh ; Duarte, Juan-Pablo ; Medury, Aditya ; Chenming Hu ; Chauhan, Yogesh S.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    287
  • Lastpage
    288
  • Abstract
    Emerging market of RFSOI applications has motivated us to come up with the robust compact model for RFSOI MOSFETs. In this work, we have validated the RF capabilities of BSIM-IMG model which is the latest industry standard compact model for independent double gate MOSFETs. Results are validated with the experimental S-parameter data measured. Model shows good agreement for different biases over wide frequency range from 100KHz-8.5GHz.
  • Keywords
    MOSFET; S-parameters; semiconductor device models; silicon-on-insulator; BSIM-IMG model; RF capabilities; RF-SOI MOSFET; experimental S-parameter data; frequency 100 kHz to 8.5 GHz; independent double gate MOSFET; industry standard compact model; robust compact model; Logic gates; MOSFET; Radio frequency; Semiconductor device modeling; Silicon; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175688
  • Filename
    7175688