DocumentCode
3390047
Title
Radiation design test data for advanced CMOS product
Author
Maher, M.C.
Author_Institution
Nat. Semicond. Corp., South Portland, ME, USA
fYear
1992
fDate
1992
Firstpage
58
Lastpage
66
Abstract
Radiation test data is presented for different radiation environments as performed on National Semiconductor´s FACT Advanced CMOS microcircuit family. Over twenty device types have been evaluated by independent investigators, users and by National.
Keywords
CMOS integrated circuits; aerospace instrumentation; aerospace simulation; gamma-ray effects; integrated circuit testing; logic arrays; logic testing; military equipment; radiation hardening (electronics); space vehicles; FACT logic line; advanced CMOS product; radiation design test data; radiation hardness assurance; space environments; tactical environments; total ionising dose testing; Certification; Environmental economics; Logic design; Manufacturing processes; Military equipment; Packaging; Passivation; Performance evaluation; Semiconductor device manufacture; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1992. Workshop Record., 1992 IEEE
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-0930-8
Type
conf
DOI
10.1109/REDW.1992.247323
Filename
247323
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