DocumentCode
3390053
Title
Setting performance targets in a 300 mm wafer fabrication facility
Author
Govind, Nirmal ; Fronckowiak, David
Author_Institution
Dept. of Ind. & Manuf. Eng., Pennsylvania State Univ., USA
fYear
2003
fDate
31 March-1 April 2003
Firstpage
75
Lastpage
79
Abstract
Evaluation of fab performance during the ramp-up phase is important since sufficient time should be allowed to develop processes with the designed specifications while productivity has to be maintained at a desired level to meet the ramp schedule. Setting targets for production in such an environment is an important task. Daily production targets help answer the question of whether the fab is performing as well as it should be, given the operating conditions. In this paper, we address the issue of calculating productivity and WIP targets to measure production performance given the fact that the fab is in a ramp mode. Since historical data and reliable benchmarks are not currently available to compare 300 mm fab performance measures, we developed a method for setting production targets. This paper describes the fab performance measures - productivity, work in process (WIP) and cycle time being used to track progress, a methodology to set targets for these measures and the implementation of the methodology using the advanced real time tracking and reporting tools available. The methodology developed is general enough that it can be used to set production targets in fabs which are not in the ramp-up phase.
Keywords
semiconductor device manufacture; 300 mm; cycle time; production target; productivity; ramp-up phase; real-time tracking; semiconductor manufacturing; wafer fabrication facility; work-in-process; Current measurement; Fabrication; Industrial engineering; Job shop scheduling; Manufacturing industries; Manufacturing processes; Microelectronics; Process design; Production; Productivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
ISSN
1078-8743
Print_ISBN
0-7803-7681-1
Type
conf
DOI
10.1109/ASMC.2003.1194471
Filename
1194471
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