Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications

The authors describe the low dose radiation test results performed on Advanced CMOS technology (AC/ACT) series parts for a spaceflight project. The parts were procured to Standard Military Drawings (SMD) and MIL-STD-883 specifications. Radiation testing was performed on 32 different part types at dose rates ranging from 0.07 to 1.44 rads(Si)/sec. at steps of 5, 10, 20, 30, 50, 75, 100, 200 and 300 krads(Si). Annealing was performed after the 100 krads(Si) step for 168 hours at 25 degrees C and after the 300 krads(Si) step for 168 hours at 100 degrees C. Most parts passed functional tests up to 100 krads(Si) exposure, but showed increases in quiescent current (I_cc) measurements over the pre-irradiation specification limits in the manufacturer´s data sheets. This I_cc degradation varied for different part types and lot data codes. These test results confirmed the need for lot sample radiation testing of AC/ACT parts for space flight applications.