• DocumentCode
    3390099
  • Title

    A dynamic system regulation measure for increasing effective capacity: the X-factor theory

  • Author

    Delp, D. ; Si, J. ; Hwang, Y. ; Pei, B.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2003
  • fDate
    31 March-1 April 2003
  • Firstpage
    81
  • Lastpage
    88
  • Abstract
    Due to the complex nature of semiconductor manufacturing it is evident that a single scheduling or regulation technique cannot best optimize the system dynamics for reducing cycle time and increasing throughput. The throughput of the system can increase to the effective capacity level of the system. When the throughput of the system approaches the effective capacity the product cycle time can dramatically increase. The "knee" of the performance curve indicates an operating point for fabs to maximize throughput while keeping the product cycle time relatively low. By increasing the effective capacity, i.e. adding a machine or improving a process, the product cycle time can be lowered or the system throughput increased by producing a shift in the "knee" of the performance curve. The bottleneck, typically defined as the most heavily utilized machine group, is often the target for increasing the system effective capacity. We will analyze the bottleneck along with other system capacity regulation measures to systematically study the relationship between bottleneck, X-factor, cycle time, and throughput measurements.
  • Keywords
    regulation; semiconductor device manufacture; X-factor; bottleneck analysis; cycle time; dynamic system regulation; effective capacity; performance curve; semiconductor manufacturing; throughput; Costs; Dynamic scheduling; Electronics industry; Information management; Job shop scheduling; Production; Productivity; Semiconductor device manufacture; Throughput; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-7681-1
  • Type

    conf

  • DOI
    10.1109/ASMC.2003.1194473
  • Filename
    1194473