• DocumentCode
    3390406
  • Title

    Improving redundancy addition and removal using unreachable states for sequential circuits

  • Author

    Yang, Xiaoqing ; Xiao, Zigang ; Wu, Y.L.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3172
  • Lastpage
    3175
  • Abstract
    Redundancy Addition and Removal (RAR), one of the major combinational logic perturbation techniques, has been shown to be very useful for many EDA optimization tasks. However, all the currently known RAR techniques did not analyze and make use of unreachable states, which are abundant in sequential circuits. These unreachable states can be considered as input don´t cares and can add an extra flexibility in locating alternative wires. In this paper, we study the fundamental theory and propose a reasoning scheme for locating alternative wires without performing wasteful redundancy tests. To explore the deeper effect of unreachable states, the concept is extended to illegal assignments and the fault independent redundancy identification is applied on illegal assignments to find flexibilities introduced by unreachable states. On the experiments carried for both MCNC and industry benchmarks, it is shown that using such an idea, a remarkable increase of more than 100% (averagely) in the number of alternative wires can be found, which should be quite useful as most of today´s practical circuits are sequential.
  • Keywords
    combinatorial mathematics; redundancy; sequential circuits; EDA optimization task; alternative wire; combinational logic perturbation; fault independent redundancy identification; redundancy addition and removal; redundancy test; sequential circuits; unreachable states; Circuit faults; Circuit testing; Electronic design automation and methodology; Fault diagnosis; Logic; Performance evaluation; Perturbation methods; Redundancy; Sequential circuits; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537956
  • Filename
    5537956