Design of a measurement and interface integrated circuit for characterization of switched current memory cells

Author

Pereira, Adriano M. ; Pimenta, Tales C. ; Moreno, Robson L. ; Charry, Edgar R. ; Jorge, Alberto M.

Author_Institution

EFEI, Itajuba, Brazil

fYear

1998

fDate

4-7 Jan 1998

Firstpage

240

Lastpage

243

Abstract

Dynamic current mirrors, or SI current cells, are widely used in analog signal processing circuits. They could be implemented using a standard cell methodology if an SI cell library is available. Aiming at the creation of that library, this work presents the design of the measuring system and the interface circuits (on a chip) necessary to test SI cells with precision of 450 ppm and operation frequency of 3 MHz. Measurements performed on the prototypes show that the harmonics components and the noise level are 70 dB smaller than the fundamental and the total harmonic distortion is 0.04%

Keywords

analogue integrated circuits; analogue processing circuits; analogue storage; integrated circuit design; integrated circuit testing; switched current circuits; SI cell library; SI current cells; SI memory cell characterization; THD; dynamic current mirrors; harmonics components; measurement/interface IC design; noise level; switched current memory cells; total harmonic distortion; Circuit testing; Distortion measurement; Frequency measurement; Integrated circuit measurements; Libraries; Mirrors; Noise measurement; Semiconductor device measurement; Signal processing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on

Conference_Location

Chennai

ISSN

1063-9667

Print_ISBN

0-8186-8224-8

Type

conf

DOI

10.1109/ICVD.1998.646610

Filename

646610