• DocumentCode
    3392280
  • Title

    Two levels vs. three levels of maintenance: the cost

  • Author

    Hughes, Wallace ; Kim, Matthew M. ; McGauley, Richard M. ; Mortin, Davie E. ; Serabo, Gregory A.

  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Firstpage
    19
  • Lastpage
    25
  • Abstract
    The authors describe level-of-repair analyses for four major US Army weapon/communication systems using the Optimum Supply and Maintenance Model (OSAMM). The four systems are: Single Channel Objective Tactical Terminal (SCOTT); Global Positioning System (GPS); Single Channel Ground and Airborne Radio System (SINCGARS); and Hawk guided missile. The analyses compare the costs associated with a strict two-level maintenance concept with the resulting costs of other maintenance alternatives (e.g. three- and four-level, with and without screening). The authors identify the sensitivity of the resulting cost to such factors as inaccurate built-in test (BIT); TMDE (test measurement and diagnostic equipment) costs, including test program sets; provisioning levels and supply support measures, including number and placement of test equipment and maintenance personnel; and the impact of repair vs. discard. The cost of each policy is assessed not only in terms of dollars, but also in terms of operational availability and system readiness
  • Keywords
    automatic testing; economics; electronic equipment testing; maintenance engineering; military systems; missiles; radio systems; satellite relay systems; weapons; Global Positioning System; Hawk guided missile; Optimum Supply and Maintenance Model; Single Channel Ground and Airborne Radio System; Single Channel Objective Tactical Terminal; TMDE; US Army weapon/communication systems; built-in test; cost; level-of-repair analyses; operational availability; readiness; three level maintenance; two-level maintenance; Availability; Built-in self-test; Costs; Global Positioning System; Missiles; Performance analysis; Performance evaluation; Test equipment; Testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
  • Conference_Location
    Philadelphia, PA
  • Type

    conf

  • DOI
    10.1109/AUTEST.1989.81093
  • Filename
    81093