EO sampling methods for real-time THz imaging

Author

Hattori, Toshiaki ; Sakamoto, Masaya

Author_Institution

Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba

fYear

2007

fDate

2-9 Sept. 2007

Firstpage

915

Lastpage

916

Abstract

We have developed a method of real-time terahertz (THz) imaging in which image deformation due to nonuniformity of residual birefringence in the electro-optic (EO) sampling crystal is corrected. Real-time THz imaging using intense THz pulses and two-dimensional EO sampling can suffer from birefringence nonuniformity of the EO crystal since the birefringence is explicitly used for the linear detection of the THz field. In the proposed method, the distribution of the residual birefringence of the EO crystal is measured and used for image correction. Deformation-free images of the spatial profile of a focused THz pulse were obtained.

Keywords

birefringence; crystals; electro-optical devices; sampling methods; submillimetre wave imaging; submillimetre wave spectra; THz pulses; birefringence nonuniformity; deformation-free images; electro-optic sampling crystal; image correction; image deformation; linear detection; real-time THz imaging; residual birefringence; sampling methods; Birefringence; Electrooptic effects; Image sampling; Optical imaging; Optical polarization; Optical pulse generation; Probes; Pulse amplifiers; Sampling methods; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on

Conference_Location

Cardiff

Print_ISBN

978-1-4244-1438-3

Type

conf

DOI

10.1109/ICIMW.2007.4516790

Filename

4516790