• DocumentCode
    3392849
  • Title

    Electron impact ionization and dielectric breakdown in the liquid noble gases: a Monte Carlo simulation

  • Author

    Jones, H.M. ; Kunhardt, E.E.

  • Author_Institution
    Weber Res. Inst., Polytech. Univ., Farmingdale, NY, USA
  • fYear
    1996
  • fDate
    15-19 Jul 1996
  • Firstpage
    369
  • Lastpage
    372
  • Abstract
    Determining whether electron avalanches can occur in the liquid phase is of fundamental importance when formulating models for electrical breakdown in liquids. The electron energy distribution function, drift velocity, and ionization rate for electrons in liquid xenon have been calculated using a kinetic model for electron transport. The electron scattering rates have been obtained using the Van Hove approach in which the liquid is characterized by the dynamic structure function, S(q&oarr;, ω). The threshold field for ionization, E, (such that the ionization coefficient, α≠0 for E>Et ) is found to be ≈400 kV/cm. This value for Et as well as those for α are in good agreement with experiment. These results, and those of Kunhardt (1991), are used to assess models for pulsed breakdown in the liquid noble gases
  • Keywords
    Monte Carlo methods; avalanche breakdown; dielectric liquids; electric breakdown; impact ionisation; xenon; Monte Carlo simulation; Van Hove theory; Xe; dielectric breakdown; drift velocity; dynamic structure function; electron avalanche; electron energy distribution function; electron impact ionization; electron scattering rate; electron transport; kinetic model; liquid noble gas; pulsed breakdown; Dielectric breakdown; Distribution functions; Electric breakdown; Electron mobility; Gases; Impact ionization; Kinetic theory; Liquids; Scattering; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Dielectric Liquids, 1996, ICDL '96., 12th International Conference on
  • Conference_Location
    Roma
  • Print_ISBN
    0-7803-3560-0
  • Type

    conf

  • DOI
    10.1109/ICDL.1996.565519
  • Filename
    565519