Experimental verification of a new technique for system level characterization of the radiated emissions of unknown sources inside cavities from unit level measurements

An experimental verification of a new method for the prediction of system level radiation of electronic devices inside cavities is presented. The method starts from a unit level characterization of the equipment, a representation of the equipment by a model of equivalent currents and a further computation of the interaction of this current model with a geometrical model of the cavity. The idea is to replace a system level measurement that is very expensive for a unit level measurement plus a computation. Comparisons between the method and some measurements at system level inside a cavity satellite mock-up have been performed. The comparison proves the validity of the method for EMC applications. Moreover, the results have been analyzed to study the possibilities for the improvement of the approach.