• DocumentCode
    3396343
  • Title

    Including the impact of connecting vias in the performance metric evaluation for board-level optimization of decoupling capacitors

  • Author

    Mondal, Mosin ; Connor, Samuel ; Archambeault, Bruce ; Jandhyala, Vikram

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    Existing decoupling capacitor optimization techniques tend to neglect the impact of via parasitics while evaluating the performance metrics. This work demonstrates that ignoring the impact of connecting vias can produce optimistic results leading to functional failure. An efficient method for including via-parasitics in the performance metric evaluation is presented for more accurate design optimization.
  • Keywords
    capacitors; network synthesis; simulated annealing; board-level optimization; decoupling capacitor optimization techniques; design optimization; performance metric evaluation; simulated annealing; Design optimization; Frequency; Impedance; Joining processes; Measurement; Optimization methods; Paramagnetic resonance; Power capacitors; Simulated annealing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2873-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2008.4675907
  • Filename
    4675907