DocumentCode
3396501
Title
High frequency loss characterization of FCPBGA package materials with humidity and temperature variation
Author
Audet, Jean ; Na, Nanju
fYear
2008
fDate
27-29 Oct. 2008
Firstpage
221
Lastpage
224
Abstract
As electronic device modules are operated in varying temperature and humidity conditions over cycles, package substrates experience material property changes including electrical characteristics in different environment conditions with electrical performance affected in particular at high frequencies. This paper presents temperature and moisture effect on electrical performance of high speed interconnects through raw material characterization and high frequency loss measurements on package interconnect. Measurements on raw material and differential test conductor structures show a great loss dependence on temperature and moisture with a significant loss increase in higher temperature and moisture condition at high frequencies The paper also discusses package loss budget to application space relation taking into account those effects in high speed designs.
Keywords
ball grid arrays; flip-chip devices; integrated circuit interconnections; plastic packaging; FCPBGA package materials; electrical characteristics; electronic device modules; flip-chip plastic ball grid array; high frequency loss characterization; high frequency loss measurements; humidity variation; package loss budget; package substrates; temperature variation; Electric variables; Electronics packaging; Frequency measurement; Humidity; Loss measurement; Material properties; Moisture measurement; Raw materials; Temperature dependence; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2873-1
Type
conf
DOI
10.1109/EPEP.2008.4675919
Filename
4675919
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