Capacitive Impedance Spectroscopy measuring system

Author

Xi, Zhaohui ; Stoynov, Z. ; Vladikova, D. ; Nuncho, Nunev

Author_Institution

Coll. of Meas. Control Tech & Commun. Eng., Harbin Univ. of Sci. & Technol., Harbin, China

fYear

2009

fDate

19-23 July 2009

Firstpage

1092

Lastpage

1093

Abstract

During the last years the method of the Electrochemical Impedance Spectroscopy has been intensively developed. It is the most powerful electrochemical method, because of it unique ability to investigate the structure and the properties of the objects in a wide frequency range. The Capacitive Impedance Spectroscopy (CIS) is of special interest. The further development of this principle is given in the current work. It gives an opportunity to investigate the electric properties of different kinds of materials. A special measuring system is developed for this purpose. A modern computer techniques with a special data analyze software is also described.

Keywords

electrochemical impedance spectroscopy; permittivity; capacitive impedance spectroscopy measuring system; data analyze software; electric properties; electrochemical method; Application software; Computational Intelligence Society; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Electrodes; Electromagnetic wave polarization; Impedance measurement; Permittivity measurement; capacitive impedance spectroscopy; complex electric permittivity; electrochemical impedance spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the

Conference_Location

Harbin

Print_ISBN

978-1-4244-4367-3

Electronic_ISBN

978-1-4244-4368-0

Type

conf

DOI

10.1109/ICPADM.2009.5252302

Filename

5252302