• DocumentCode
    3396984
  • Title

    Time-frequency analysis of flicker-burst visual evoked responses

  • Author

    Henning, G. ; Hoenecke, O. ; Husar, P. ; Schellhorn, K. ; Trautwein, U.

  • Author_Institution
    Inst. fur Biomed. Tech. und Inf., Tech. Univ. Ilmenau, Germany
  • Volume
    2
  • fYear
    1995
  • fDate
    20-23 Sep 1995
  • Firstpage
    1077
  • Abstract
    Knowing the properties of the EEG-signal related to a visual stimulus is of fundamental importance for an adequate design of a signal detection method, e.g. In objective sensory function diagnostics. From a signal-theoretical point of view the steady state visual evoked response (VER), but under physiological aspects the transient VER seems to be more appropriate for reliable signal detection. A stimulation with flicker-bursts is proposed combining both methods. The EEG/VER-signals have been analyzed with different methods of time-frequency analysis: spectrogram, pseudo-Wigner distribution, cone-kernel representation, reduced-interference distribution are applied to real signals. Concerning feature extraction of the stimulus-method, the reduced-interference distribution offers the best properties
  • Keywords
    Wigner distribution; electroencephalography; feature extraction; medical signal processing; signal detection; spectral analysis; time-frequency analysis; visual evoked potentials; EEG-signal properties; cone-kernel representation; electrodiagnostics; flicker-burst visual evoked responses; objective sensory function diagnostics; physiological aspects; pseudo-Wigner distribution; reduced-interference distribution; reliable signal detection; signal detection method design; spectrogram; steady state visual evoked response; visual stimulus; Electroencephalography; Power harmonic filters; Retina; Signal analysis; Signal detection; Signal to noise ratio; Spectrogram; Steady-state; Time frequency analysis; Visual system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1995., IEEE 17th Annual Conference
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-2475-7
  • Type

    conf

  • DOI
    10.1109/IEMBS.1995.579498
  • Filename
    579498