• DocumentCode
    3397660
  • Title

    Planning for SOC test with power constraint based on quantum algorithm

  • Author

    Chuan-Pei, Xu ; Jing, Zhang ; Xue-Yun, Lu

  • Author_Institution
    Dept. of Electron. Eng., Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2010
  • fDate
    22-24 Oct. 2010
  • Firstpage
    660
  • Lastpage
    664
  • Abstract
    Combining with the characteristic of SOC test planning and test power, the optimization for SOC test based on quantum algorithm is introduced in this paper, in the paper, the corresponding mathematical model is established and the design of algorithm is given. After establishing the model with appropriate parameters, the power limit is ascertained, then the optimal individual can be distinguished. During the process of algorithm realization, genetic factors are changed according to a discriminant function, and the shortest test times with power constraints can be find out. Validation of the algorithm is made with ITC´02 SOC test benchmarks finally. Experimental results demonstrate the advantages of quantum algorithm compared with other algorithms.
  • Keywords
    logic testing; power aware computing; quantum computing; system-on-chip; SOC test planning; SOC test power; discriminant function; genetic factors; quantum algorithm; system-on-chip; Benchmark testing; Heating; Quantum computing; SOC test; power constraints; quantum algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-6834-8
  • Type

    conf

  • DOI
    10.1109/ICISS.2010.5655480
  • Filename
    5655480