DocumentCode
3397660
Title
Planning for SOC test with power constraint based on quantum algorithm
Author
Chuan-Pei, Xu ; Jing, Zhang ; Xue-Yun, Lu
Author_Institution
Dept. of Electron. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear
2010
fDate
22-24 Oct. 2010
Firstpage
660
Lastpage
664
Abstract
Combining with the characteristic of SOC test planning and test power, the optimization for SOC test based on quantum algorithm is introduced in this paper, in the paper, the corresponding mathematical model is established and the design of algorithm is given. After establishing the model with appropriate parameters, the power limit is ascertained, then the optimal individual can be distinguished. During the process of algorithm realization, genetic factors are changed according to a discriminant function, and the shortest test times with power constraints can be find out. Validation of the algorithm is made with ITC´02 SOC test benchmarks finally. Experimental results demonstrate the advantages of quantum algorithm compared with other algorithms.
Keywords
logic testing; power aware computing; quantum computing; system-on-chip; SOC test planning; SOC test power; discriminant function; genetic factors; quantum algorithm; system-on-chip; Benchmark testing; Heating; Quantum computing; SOC test; power constraints; quantum algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Computing and Integrated Systems (ICISS), 2010 International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-6834-8
Type
conf
DOI
10.1109/ICISS.2010.5655480
Filename
5655480
Link To Document