DocumentCode
3398349
Title
An investigation of neural networks for F-16 fault diagnosis. I. System description
Author
McDuff, Richard J. ; Simpson, Patrick K. ; Gunning, David
Author_Institution
Gen. Dynamics Electron. Div., San Diego, CA, USA
fYear
1989
fDate
25-28 Sep 1989
Firstpage
351
Lastpage
357
Abstract
The authors report results of ongoing research exploring the use of artificial neural networks (ANNs) for F-16 flight line diagnostics. ANNs hold the promise of solving difficult logistics problems such as multiple fault diagnosis, prognostication, changing configurations and environments, and inaccurate diagnosis attributable to incomplete and/or flawed rules. The authors tested three representative ANNs to see which type worked best for the problem considered. The authors chose back propagation (BPN) and counterpropagation (CPN) because they are considered to be two of the more promising pattern matching paradigms. The binary adaptive resonance theory I (ART1) was also chosen because it learns faster than CPN or BPN and has online adaptation (i.e. does not have to be totally retrained every time a new pattern is discovered). Online adaptation is a powerful attribute, allowing new associations to be immediately incorporated into the knowledge base on the flight line or wherever needed. The authors explain the advantages and drawbacks to each network tested and describe how they were trained using historical flight line data. Of the three ANNs examined, ART1 proved to be the most appropriate and was able to produce multiple-symptom-to-multiple-fault diagnoses
Keywords
aerospace computing; aircraft instrumentation; automatic test equipment; automatic testing; electronic equipment testing; fault location; knowledge based systems; military computing; military equipment; neural nets; F-16 fault diagnosis; artificial neural networks; back propagation; binary adaptive resonance theory; counterpropagation; flight line diagnostics; knowledge base; military aircraft; multiple-symptom-to-multiple-fault diagnoses; online adaptation; pattern matching paradigms; prognostication; Artificial neural networks; Circuit faults; Fault diagnosis; Logistics; Neural networks; Pattern matching; Resonance; Testing; Time factors; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location
Philadelphia, PA
Type
conf
DOI
10.1109/AUTEST.1989.81147
Filename
81147
Link To Document